Impact of the thickness on the optical and electronic and structural properties of sputtered Cu2S thin films.

Autor: Velasquez-Ordoñez, J. R.1 (AUTHOR), Rivera-Taco, J.1 (AUTHOR), Pacheco-Salazar, D. G.1 (AUTHOR), Coaquira, J. A. H.2 (AUTHOR), Maldonado, J. L.3 (AUTHOR), Guerra, J. A.4 (AUTHOR), Llontop, P.4 (AUTHOR), Morais, P. C.2,5 (AUTHOR), Aragón, F. F. H.2 (AUTHOR) ffharagon@gmail.com
Zdroj: Journal of Applied Physics. 2/14/2024, Vol. 135 Issue 6, p1-11. 11p.
Databáze: Academic Search Ultimate