Quantum Efficiency Measurement and Modeling of Silicon Sensors Optimized for Soft X-ray Detection.

Autor: Carulla, Maria1 (AUTHOR) filippo.baruffaldi@psi.ch, Barten, Rebecca1 (AUTHOR) anna.bergamaschi@psi.ch, Baruffaldi, Filippo1 (AUTHOR) tim.butcher@psi.ch, Bergamaschi, Anna1 (AUTHOR) roberto.dinapoli@psi.ch, Borghi, Giacomo2 (AUTHOR) giacomo.borghi@polimi.it, Boscardin, Maurizio2 (AUTHOR) boscardi@fbk.eu, Brückner, Martin1 (AUTHOR) erik.froejdh@psi.ch, Butcher, Tim A.1 (AUTHOR) dominic.greiffenberg@psi.ch, Centis Vignali, Matteo2 (AUTHOR) mcentisvignali@fbk.eu, Dinapoli, Roberto1 (AUTHOR) julian.heymes@psi.ch, Ebner, Simon1 (AUTHOR) viktoria.hinger@psi.ch, Ficorella, Francesco2 (AUTHOR) ficorella@fbk.eu, Fröjdh, Erik1 (AUTHOR) davide.mezza@psi.ch, Greiffenberg, Dominic1 (AUTHOR) konstantinos.moustakas@psi.ch, Hammad Ali, Omar2 (AUTHOR) ohammadali@fbk.eu, Hasanaj, Shqipe1 (AUTHOR) aldo.mozzanica@psi.ch, Heymes, Julian1 (AUTHOR) kirsty.paton@psi.ch, Hinger, Viktoria1 (AUTHOR) bernd.schmitt@psi.ch, King, Thomas1 (AUTHOR) patrick.sieberer@psi.ch, Kozlowski, Pawel1 (AUTHOR) xiangyu.xie@psi.ch
Zdroj: Sensors (14248220). Feb2024, Vol. 24 Issue 3, p942. 19p.
Databáze: Academic Search Ultimate
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