ISTFA 2023 OPTICAL FAULT ISOLATION (OFI), TEST, AND DIAGNOSTICS USER GROUP.
| Autor: | Bockelman, Dan dan.bockelman@intel.com, Bodoh, Dan dan.bodoh@nxp.com, Leslie, Neel neel.leslie@thermofisher.com, Distelhurst, Kevin kevin.distelhurst@globalfoundries.com |
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| Zdroj: | Electronic Device Failure Analysis. Feb2024, Vol. 26 Issue 1, p44-45. 2p. |
| Databáze: | Academic Search Ultimate |
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