ISTFA 2023 SYSTEM IN PACKAGE (SIP) USER GROUP.

Autor: Yan Li yan.a.li@samsung.com, Tracy, Bryan btracy@tesla.com, Wentao Qin wentao.qin@microchip.com
Zdroj: Electronic Device Failure Analysis. Feb2024, Vol. 26 Issue 1, p42-43. 2p.
Databáze: Academic Search Ultimate