ADVANCED CHARACTERIZATION OF MATERIALS USING ATOM PROBE TOMOGRAPHY.
| Autor: | Garcia, Jacob M.1 jacob.garcia@nist.gov, Chiaramonti, Ann N.1 |
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| Zdroj: | Electronic Device Failure Analysis. Feb2024, Vol. 26 Issue 1, p14-21. 7p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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