A critical review and meta-analysis of xenon-on-carbon sputter yield data.
| Autor: | Polk, James E.1 (AUTHOR) james.e.polk@jpl.nasa.gov |
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| Zdroj: | Journal of Applied Physics. 1/28/2024, Vol. 135 Issue 4, p1-20. 20p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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