Nonparametric failure time: Time‐to‐event machine learning with heteroskedastic Bayesian additive regression trees and low information omnibus Dirichlet process mixtures.

Autor: Sparapani, Rodney A.1 (AUTHOR) rsparapa@mcw.edu, Logan, Brent R.1 (AUTHOR), Maiers, Martin J.2 (AUTHOR), Laud, Purushottam W.1 (AUTHOR), McCulloch, Robert E.3 (AUTHOR)
Zdroj: Biometrics. Dec2023, Vol. 79 Issue 4, p3023-3037. 15p.
Databáze: Academic Search Ultimate
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