A Highly Integrated AFM-SEM Correlative Analysis Platform.

Autor:	Alipour, A1 (AUTHOR), Arat, K T1 (AUTHOR), Alemansour, H1 (AUTHOR), Montes, L1 (AUTHOR), Gardiner, J1 (AUTHOR), Diederichs, J1 (AUTHOR), Colvin, B1 (AUTHOR), Amann, A1 (AUTHOR), Jensen, K1 (AUTHOR), Neils, W1 (AUTHOR), Spagna, S1 (AUTHOR) stefano@qdusa.com, Stühn, L2 (AUTHOR), Seibert, S2 (AUTHOR), Frerichs, H2 (AUTHOR), Wolff, M2 (AUTHOR), Schwalb, C H2 (AUTHOR)
Zdroj:	Microscopy Today. Nov2023, Vol. 31 Issue 6, p17-22. 6p.
Databáze:	Academic Search Ultimate
Externí odkaz:	Zobrazit plný text záznamu