Influence of base material thickness on spectrometry of semiconductor detectors based on semi-insulating GaAs.
| Autor: | Šagátová, Andrea1 andrea.sagatova@stuba.sk, Kurucová, Nikola1, Kotorová, Soňa1, Kováčová, Eva2, Zaťko, Bohumír2 |
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| Zdroj: | EPJ Web of Conferences. 11/21/2023, Vol. 288, p1-4. 4p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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