Kinetics of Defect Formation in ZnO Subjected to a Flux of Oxygen Radicals.
| Autor: | Kotlyarevsky, M. B.1, Rogozin, I. V.2 rogozin@bdpu.org, Marakhovskiı, A. V.2 |
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| Zdroj: | Semiconductors. Jun2005, Vol. 39 Issue 6, p609-614. 6p. |
| Databáze: | Academic Search Ultimate |
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