On the Fluctuation–Dissipation of the Oxide Trapped Charge in a MOSFET Operated Down to Deep Cryogenic Temperatures.
| Autor: | Ghibaudo, G.1 (AUTHOR) gerard.ghibaudo@gmail.com |
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| Zdroj: | Fluctuation & Noise Letters. Dec2023, Vol. 22 Issue 6, p1-14. 14p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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