LASER-BASED COPPER DEPOSITION FOR SEMICONDUCTOR DEBUG APPLICATIONS.
| Autor: | DiBattista, Michael1 miked@varioscale.com, Silverman, Scott1, Mulholland, Matthew M.2 |
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| Zdroj: | Electronic Device Failure Analysis. Nov2023, Vol. 25 Issue 4, p12-16. 5p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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