Inversion model for extracting chemically resolved depth profiles across liquid interfaces of various configurations from XPS data: PROPHESY.
| Autor: | Ozon, Matthew1 matthew.ozon@oulu.fi, Tumashevich, Konstantin1, Lin, Jack J.1, Prisle, Nønne L.1 nonne.prisle@oulu.fi |
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| Zdroj: | Journal of Synchrotron Radiation. Sep2023, Vol. 30 Issue 5, p941-961. 21p. |
| Databáze: | Academic Search Ultimate |
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