Microwave Absolute Distance Measurement Method with Ten-Micron-Level Accuracy and Meter-Level Range Based on Frequency Domain Interferometry.

Autor: Tang, Longhuang1,2 (AUTHOR) jiaxing@caep.cn, Jia, Xing1,2 (AUTHOR) marcos12@126.com, Ma, Heli1,2 (AUTHOR) liushenggangpla@126.com, Liu, Shenggang1,2 (AUTHOR) ycchen16@fudan.edu.cn, Chen, Yongchao1,2 (AUTHOR) zjuttj@163.com, Tao, Tianjiong1,2 (AUTHOR) chenlongcaep@163.com, Chen, Long1,2 (AUTHOR) ceuwj@zju.edu.cn, Wu, Jian1,2 (AUTHOR) lstrus@126.com, Li, Chengjun1,2 (AUTHOR) xiangwang102@126.com, Wang, Xiang1,2 (AUTHOR), Weng, Jidong1,2 (AUTHOR) tanglonghuang@tju.edu.cn
Zdroj: Sensors (14248220). Sep2023, Vol. 23 Issue 18, p7898. 13p.
Databáze: Academic Search Ultimate
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