Raman spectroscopic characterization of SiO2 phase transformation and Si substrate stress relevant to EBC performance.

Autor: Lance, Michael J.1 (AUTHOR) lancem@ornl.gov, Ridley, Mackenzie J.1 (AUTHOR), Kane, Kenneth A.2 (AUTHOR), Pint, Bruce A.1 (AUTHOR)
Zdroj: Journal of the American Ceramic Society. Oct2023, Vol. 106 Issue 10, p6205-6210. 6p. 1 Color Photograph, 1 Black and White Photograph, 4 Graphs.
Databáze: Academic Search Ultimate