Determining Generation–Recombination Characteristics of a Semiconductor–Dielectric Interface from the Current Kinetics of Surface Minority Carrier Generation.
| Autor: | Zhdan, A. G.1, Chucheva, G. V.1 |
|---|---|
| Zdroj: | Instruments & Experimental Techniques. May/Jun2003, Vol. 46 Issue 3, p391-394. 4p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
|