Tunable Resistive Switching Behaviors and Mechanism of the W/ZnO/ITO Memory Cell.

Autor: Yu, Zhiqiang1,2,3 (AUTHOR) 221077051@stdmail.gxust.edu.cn, Jia, Jinhao1 (AUTHOR) 221068387@stdmail.gxust.edu.cn, Qu, Xinru1 (AUTHOR) 221076997@stdmail.gxust.edu.cn, Wang, Qingcheng1 (AUTHOR) 221077056@stdmail.gxust.edu.cn, Kang, Wenbo1 (AUTHOR) liubaosheng@gxust.edu.cn, Liu, Baosheng1 (AUTHOR), Xiao, Qingquan2 (AUTHOR) gaotinghong@sina.com, Gao, Tinghong2 (AUTHOR) qxie@gzu.edu.cn, Xie, Quan2 (AUTHOR)
Zdroj: Molecules. Jul2023, Vol. 28 Issue 14, p5313. 14p.
Databáze: Academic Search Ultimate
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