FAILURE ANALYSIS OF PHOTONIC INTEGRATED CIRCUITS.

Autor: Baumann, Frieder H.1 frieder.baumann@globalfoundries.com, Popielarski, Brian1, Sweeney, Ryan1, Beaudoin, Felix1, Giewont, Ken1
Zdroj: Electronic Device Failure Analysis. Aug2023, Vol. 25 Issue 3, p23-30. 6p.
Databáze: Academic Search Ultimate