FAILURE ANALYSIS OF PHOTONIC INTEGRATED CIRCUITS.
Autor: | Baumann, Frieder H.1 frieder.baumann@globalfoundries.com, Popielarski, Brian1, Sweeney, Ryan1, Beaudoin, Felix1, Giewont, Ken1 |
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Zdroj: | Electronic Device Failure Analysis. Aug2023, Vol. 25 Issue 3, p23-30. 6p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |