ADVANCEMENTS IN IMAGE PATTERN RECOGNITION FOR LOCK-IN THERMOGRAPHY HOTSPOT DETECTION AND CLASSIFICATION WITH SUPERVISED LEARNING.

Autor: Kyu Kyu Thinn1 thinn.kyukyu@infineon.com, Rui Zhen Tan2, Teh Tict Eng1, Ming Xue1
Zdroj: Electronic Device Failure Analysis. Aug2023, Vol. 25 Issue 3, p4-9. 6p.
Databáze: Academic Search Ultimate