ADVANCEMENTS IN IMAGE PATTERN RECOGNITION FOR LOCK-IN THERMOGRAPHY HOTSPOT DETECTION AND CLASSIFICATION WITH SUPERVISED LEARNING.
Autor: | Kyu Kyu Thinn1 thinn.kyukyu@infineon.com, Rui Zhen Tan2, Teh Tict Eng1, Ming Xue1 |
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Zdroj: | Electronic Device Failure Analysis. Aug2023, Vol. 25 Issue 3, p4-9. 6p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |