The dependence of proton energy on the parametric degradation in silicon bipolar junction transistors.

Autor: Hegde, Vinayakprasanna N.1 (AUTHOR) vinayakpnh@gmail.com, Bharathi, M. N.2 (AUTHOR), Pradeep, T. M.3 (AUTHOR), Gnana Prakash, A. P.4 (AUTHOR)
Zdroj: Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena. Jul/Aug2023, Vol. 178 Issue 7/8, p1012-1024. 13p.
Databáze: Academic Search Ultimate
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