Ellipsometry examination of copper alloys with transitive metals.
| Autor: | Filipov, Y. V.1 filipov@univ.kiev.ua, Staschuk, V. S.1, Poperenko, L. V.1, Vovchenko, V. V.1 |
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| Zdroj: | Semiconductor Physics, Quantum Electronics & Optoelectronics. 2004, Vol. 7 Issue 3, p287-290. 4p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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