ISTFA 2022 OPTICAL FAULT ISOLATION, TEST, AND DIAGNOSIS USER GROUP.

Autor: Bockelman, Dan dan.bockelman@intel.com, Leslie, Neel neel.leslie@thermofisher.com, Distelhurst, Kevin kevin.distelhurst@globalfoundries.com
Zdroj: Electronic Device Failure Analysis. Feb2023, Vol. 25 Issue 1, p36-37. 2p.
Databáze: Academic Search Ultimate