Identifying cause-and-effect relationships of manufacturing errors using sequence-to-sequence learning.

Autor: Reimer, Jeff1 (AUTHOR) reimer@l3s.de, Wang, Yandong1 (AUTHOR), Laridi, Sofiane1 (AUTHOR), Urdich, Juergen2 (AUTHOR), Wilmsmeier, Sören3 (AUTHOR), Palmer, Gregory1 (AUTHOR)
Zdroj: Scientific Reports. 12/25/2022, Vol. 12 Issue 1, p1-11. 11p.
Databáze: Academic Search Ultimate
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