Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy.

Autor: Ihara, Shiro1 (AUTHOR) ihara-shiro@cm.kyushu-u.ac.jp, Saito, Hikaru1,2 (AUTHOR), Yoshinaga, Mizumo3 (AUTHOR), Avala, Lavakumar1 (AUTHOR), Murayama, Mitsuhiro1,4,5 (AUTHOR)
Zdroj: Scientific Reports. 9/28/2022, Vol. 12 Issue 1, p1-13. 13p.
Databáze: Academic Search Ultimate
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