The Levene test based-leakage assessment.

Autor: Wang, Yaru1,2 (AUTHOR) wangyaru2018@126.com, Tang, Ming1,2 (AUTHOR) m.tang@126.com, Wang, Pengbo1,2 (AUTHOR) wpb2011@whu.edu.cn, Liu, Botao1,2 (AUTHOR) teslal0505@foxmail.com, Tian, Rui3 (AUTHOR) tianr12@163.com
Zdroj: Integration: The VLSI Journal. Nov2022, Vol. 87, p182-193. 12p.
Databáze: Academic Search Ultimate
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