Nano or Non-Nano: the Key Aspect of the Measurement Method.

Autor: Sohn, M.1 myriam.sohn@basf.com, Wohlleben, W.1, Müller, P.1, Botin, D.1, Giesinger, J.1, Schnyder, M.1, Kruś, S.1, Acker, S.1, Herzog, B.1
Zdroj: SOFW Journal (English version). Jul/Aug2022, Vol. 148 Issue 7/8, p2-9. 8p.
Databáze: Academic Search Ultimate