A BRIEF OVERVIEW OF SCANNING TRANSMISSION ELECTRON MICROSCOPY IN A SCANNING ELECTRON MICROSCOPE.
| Autor: | Holm, Jason1 jason.holm@nist.gov |
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| Zdroj: | Electronic Device Failure Analysis. Nov2021, Vol. 23 Issue 4, p18-26. 7p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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