Laser ablation of Ga‐Sb‐Te thin films monitored with quadrupole ion trap time‐of‐flight mass spectrometry.
Autor: | Mandal, Govinda1 (AUTHOR), Gorylová, Magdaléna2 (AUTHOR), Nazabal, Virginie2,3 (AUTHOR), Němec, Petr2 (AUTHOR), Havel, Josef1 (AUTHOR) havel@chemi.muni.cz |
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Zdroj: | Journal of the American Ceramic Society. Dec2021, Vol. 104 Issue 12, p6643-6652. 10p. 1 Diagram, 2 Charts, 5 Graphs. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |