Laser ablation of Ga‐Sb‐Te thin films monitored with quadrupole ion trap time‐of‐flight mass spectrometry.

Autor: Mandal, Govinda1 (AUTHOR), Gorylová, Magdaléna2 (AUTHOR), Nazabal, Virginie2,3 (AUTHOR), Němec, Petr2 (AUTHOR), Havel, Josef1 (AUTHOR) havel@chemi.muni.cz
Zdroj: Journal of the American Ceramic Society. Dec2021, Vol. 104 Issue 12, p6643-6652. 10p. 1 Diagram, 2 Charts, 5 Graphs.
Databáze: Academic Search Ultimate