A new single probe scanning method for on-machine measurement of roundness error.
| Autor: | Duan, Bin1,2 (AUTHOR), Yin, Ziqiang1,2 (AUTHOR) zqyin@gdut.edu.cn, Chai, Ning1,2 (AUTHOR), Meng, Songtao1,2 (AUTHOR), Yao, Jianhua1,2 (AUTHOR) |
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| Zdroj: | International Journal of Advanced Manufacturing Technology. Oct2021, Vol. 116 Issue 9/10, p2861-2871. 11p. 2 Color Photographs, 7 Diagrams, 3 Charts, 9 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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