Defect evaluation using the alternating current field measurement technique.

Autor:	C. K., Low, Wong, B. S.1
Zdroj:	Insight: Non-Destructive Testing & Condition Monitoring. Oct2004, Vol. 46 Issue 10, p598-605. 8p.
Databáze:	Academic Search Ultimate
Externí odkaz:	Zobrazit plný text záznamu