The aging analysis method of IGBT with composite failure mode based on Miner linear fatigue cumulative theory.

Autor:	Li, Lie1 (AUTHOR), He, Yigang1 (AUTHOR) yghe1221@whu.edu.cn, Wang, Lei1 (AUTHOR), Wang, Chenyuan1 (AUTHOR), Wang, Chuankun1 (AUTHOR), Wu, Xiaoxin1 (AUTHOR)
Zdroj:	Microelectronics Reliability. Jul2021, Vol. 122, pN.PAG-N.PAG. 1p.
Databáze:	Academic Search Ultimate
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect