Advanced method for electrical characterization of carrier-selective passivating contacts using transfer-length-method measurements under variable illumination.
Autor: | Senaud, L.-L.1,2 (AUTHOR) laurie-lou.senaud@csem.ch, Procel, P.3,4 (AUTHOR), Christmann, G.1 (AUTHOR), Descoeudres, A.1 (AUTHOR), Geissbühler, J.1 (AUTHOR), Allebé, C.1 (AUTHOR), Badel, N.1 (AUTHOR), Wyss, P.1 (AUTHOR), Boccard, M.2 (AUTHOR), Isabella, O.3 (AUTHOR), Zeman, M.3 (AUTHOR), Nicolay, S.1 (AUTHOR), Despeisse, M.1 (AUTHOR), Ballif, C.1,2 (AUTHOR), Paviet-Salomon, B.1 (AUTHOR) |
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Zdroj: | Journal of Applied Physics. 5/21/2021, Vol. 129 Issue 19, p1-18. 18p. |
Databáze: | Academic Search Ultimate |
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