Machine learning applied to X-ray tomography as a new tool to analyze the voids in RRP Nb3Sn wires.
| Autor: | Bagni, T.1 tommaso.bagni@unige.ch, Bovone, G.1, Rack, A.2, Mauro, D.1, Barth, C.1, Matera, D.1, Buta, F.1, Senatore, C.1 |
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| Zdroj: | Scientific Reports. 4/8/2021, Vol. 11 Issue 1, p1-14. 14p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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