Prediction of single event upset critical charge and sensitive volume depth by energy deposition analysis of low energy protons.
| Autor: | Zhao, Wen1,2 (AUTHOR) space_201609@163.com, Chen, Wei2 (AUTHOR), He, Chaohui1 (AUTHOR), Chen, Rongmei3 (AUTHOR), Wang, Liang4 (AUTHOR), Wang, Zujun2 (AUTHOR), Cong, Peitian2 (AUTHOR), Guo, Xiaoqiang2 (AUTHOR), Shen, Chen5 (AUTHOR) |
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| Zdroj: | Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena. Nov-Dec2020, Vol. 175 Issue 11/12, p1093-1108. 16p. |
| Databáze: | Academic Search Ultimate |
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