Using MoOx/p-Si Selective Contact for Evaluation of the Degradation of a Near-Surface Region of Silicon.
| Autor: | Kudryashov, D. A.1 (AUTHOR) kudryashovda@spbau.ru, Gudovskikh, A. S.1,2 (AUTHOR), Maksimova, A. A.2 (AUTHOR), Baranov, A. I.1 (AUTHOR), Uvarov, A. V.1 (AUTHOR), Morozov, I. A.1 (AUTHOR) |
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| Zdroj: | Technical Physics Letters. Dec2020, Vol. 46 Issue 12, p1245-1248. 4p. |
| Databáze: | Academic Search Ultimate |
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