Surface Roughness Characterization of Annealed Polycrystalline Silicon Solar Wafers Using a Laser Speckle Imaging (LSI) Technique.
| Autor: | BALAMURUGAN, R.1 balamurugan.r.sci@kct.ac.in, PRAKASAM, R.1 |
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| Zdroj: | Lasers in Engineering (Old City Publishing). 2020, Vol. 47 Issue 4-6, p317-334. 18p. |
| Databáze: | Academic Search Ultimate |
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