FAILURE ANALYSIS, STATISTICAL RISK ASSESSMENT, AND ADVANCED MODELING IN A STRUCTURED PROBLEM SOLVING APPROACH: CASE STUDY FOR A DELAMINATION DEFECT IN THE AUTOMOTIVE SEMICONDUCTOR INDUSTRY.
| Autor: | Bergés, Corinne1 corinne.berges@nxp.com |
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| Zdroj: | Electronic Device Failure Analysis. Aug2020, Vol. 22 Issue 3, p8-15. 7p. |
| Databáze: | Academic Search Ultimate |
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