Surface Defect Detection Based on Deep Convolutional Siamese Networks and Defect Saliency.
| Autor: | Rixian Liu1,2 liurixian@163.com, Minghai Yao1 |
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| Zdroj: | Acta Microscopica. 2019, Vol. 28 Issue 2, p199-207. 9p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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