Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data.
| Autor: | Borcha, M. D.1 m_borcha@ukr.net, Solodkyi, M. S.1, Balovsyak, S. V.1, Tkach, V. M.2, Hutsuliak, I. I.1, Kuzmin, A. R.1, Tkach, О. О.1, Kladko, V. P.3, Gudymenko, O. Yo.3, Liubchenko, О. І.3, Świątek, Z.4 |
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| Zdroj: | Semiconductor Physics, Quantum Electronics & Optoelectronics. 2019, Vol. 22 Issue 4, p381-386. 6p. |
| Databáze: | Academic Search Ultimate |
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