Realization of depth reference samples with surfaces amplitudes between 0.1 nm and 5 nm.
| Autor: | Finzel, Annemarie1, Dornberg, Gregor1, Görsch, Stephan1, Mitzschke, Martin1, Bauer, Jens1, Frost, Frank1 frank.frost@iom-leipzig.de, Fähnle, O., Vasdekis, A. |
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| Zdroj: | EPJ Web of Conferences. 9/20/2019, Vol. 215, p1-2. 2p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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