RECENT ADVANCES IN VLSI CHARACTERIZATION USING THETEM.
| Autor: | Baumann, Frieder H.1 frieder.baumann@globalfoundries.com |
|---|---|
| Zdroj: | Electronic Device Failure Analysis. Aug2019, Vol. 21 Issue 3, p26-32. 5p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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| Autor: | Baumann, Frieder H.1 frieder.baumann@globalfoundries.com |
|---|---|
| Zdroj: | Electronic Device Failure Analysis. Aug2019, Vol. 21 Issue 3, p26-32. 5p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
|