Exposition time analysis of AlGaN/GaN HEMT fabrication by electron beam lithography.

Autor: INDYKIEWICZ, KORNELIA1 kornelia.indykiewicz@pwr.wroc.pl, PASZKIEWICZ, BOGDAN1, PASZKIEWICZ, REGINA1
Zdroj: Optica Applicata. 2019, Vol. 49 Issue 1, p161-166. 6p.
Databáze: Academic Search Ultimate