Exposition time analysis of AlGaN/GaN HEMT fabrication by electron beam lithography.
Autor: | INDYKIEWICZ, KORNELIA1 kornelia.indykiewicz@pwr.wroc.pl, PASZKIEWICZ, BOGDAN1, PASZKIEWICZ, REGINA1 |
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Zdroj: | Optica Applicata. 2019, Vol. 49 Issue 1, p161-166. 6p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |