Reliability of connected-(r, s)-out-of-(m, n): F system.
| Autor: | Noguchi, Keiichi1, Sasaki, Masafumi2, Yanagi, Shigeru1, Yuge, Tetsushi1 |
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| Zdroj: | Electronics & Communications in Japan, Part 3: Fundamental Electronic Science. Jan1997, Vol. 80 Issue 1, p27-35. 9p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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