A NEW LOG-LOCATION REGRESSION MODEL WITH INFLUENCE DIAGNOSTICS AND RESIDUAL ANALYSIS.
Autor: | Altun, Emrah1 emrahaltun123@gmail.com, Yousof, Haitham M.2 haitham.yousof@fcom.bu.edu.eg, Hamedani, G. G.3 gholamhoss.hamedani@marquette.edu |
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Zdroj: | Facta Universitatis, Series: Mathematics & Informatics. 2018, Vol. 33 Issue 3, p417-449. 33p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |