A NEW LOG-LOCATION REGRESSION MODEL WITH INFLUENCE DIAGNOSTICS AND RESIDUAL ANALYSIS.

Autor: Altun, Emrah1 emrahaltun123@gmail.com, Yousof, Haitham M.2 haitham.yousof@fcom.bu.edu.eg, Hamedani, G. G.3 gholamhoss.hamedani@marquette.edu
Zdroj: Facta Universitatis, Series: Mathematics & Informatics. 2018, Vol. 33 Issue 3, p417-449. 33p.
Databáze: Academic Search Ultimate