Temperature dependence of conduction and low frequency noise characteristics in hydrogenated amorphous silicon thin film transistors.
| Autor: | Zhong, Kai1, Liu, Yuan2 eeliuyuan@gdut.edu.cn, Cai, Shu-Ting2, Xiong, Xiao-Ming2 |
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| Zdroj: | Modern Physics Letters B. Jan2019, Vol. 33 Issue 2, pN.PAG-N.PAG. 8p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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