Investigation of the Anisotropy of the Structural Properties of GaN(0001) Layers Grown by MOVPE on a-Plane (110) Sapphire.

Autor: Yunin, P. A.1,2 yunin@ipmras.ru, Drozdov, Yu. N.1, Khrykin, O. I.1, Grigoryev, V. A.2
Zdroj: Semiconductors. Nov2018, Vol. 52 Issue 11, p1412-1415. 4p.
Databáze: Academic Search Ultimate