On the use of grazing-incidence small-angle X-ray scattering (GISAXS) in the morphological study of ion-implanted materials.
Autor: | d'Acapito, Francesco1 dacapito@esrf.fr, Maurizio, Chiara1, Gonella, Francesco2, Cattaruzza, Elti2, Mattei, Giovanni3, Mondelli, Claudia4, Longo, Alessandro5, Martorana, Antonino6 |
---|---|
Zdroj: | Journal of Synchrotron Radiation. May2004, Vol. 11 Issue 3, p272-277. 6p. 1 Black and White Photograph, 1 Diagram, 1 Chart, 6 Graphs. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |