Development of high-temperature strain instrumentation for in situ SEM evaluation of ductility dip cracking.
| Autor: | TORRES, E. A .1,2 (AUTHOR), MONTORO, F.1 (AUTHOR), RIGHETTO, R.D.1 (AUTHOR), RAMIREZ, A.J.1 (AUTHOR) antonio.ramirez@lnnano.cnpem.br |
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| Zdroj: | Journal of Microscopy. Jun2014, Vol. 254 Issue 3, p157-165. 9p. 1 Color Photograph, 3 Black and White Photographs, 2 Diagrams, 5 Charts, 1 Graph. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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