Dynamic characterization of high-speed SiC power MOSFETs and diodes.
| Autor: | Gant, Levi1 lgant@littelfuse.com, Xuning Zhang2 xzhang@monolithsemi.com |
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| Zdroj: | EE: Evaluation Engineering. Aug2018, Vol. 57 Issue 8, p20-24. 5p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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