ESR Studies of Nanocrystalline Silicon Films Obtained by Pulsed Laser Ablation of Silicon Targets.
| Autor: | Bratus, V. Ya1 dept_5@isp.kiev.ua, Okulov, S. M.1, Kagonovich, É. B.1, Kizyak, I. M.1, Manoilov, É. G.1 |
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| Zdroj: | Semiconductors. May2004, Vol. 38 Issue 5, p598-602. 5p. |
| Databáze: | Academic Search Ultimate |
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